Wenjuan Xing, Zhonghan Yu, Changyi Liu, Hongwei Zhao. In-Situ Testing Techniques for Mechanical Properties of Materials: Development and Applications[J]. Laser & Optoelectronics Progress, 2023, 60(3): 0312015
- Laser & Optoelectronics Progress
- Vol. 60, Issue 3, 0312015 (2023)
Fig. 1. Schematic diagram of angle of compatible EBSD device
![Stretching table of MTI Instruments[33]](/richHtml/lop/2023/60/3/0312015/img_02.jpg)
Fig. 2. Stretching table of MTI Instruments[33]
![Stretching device of Kammrath & Weiss[34]](/Images/icon/loading.gif){kind=icon}
Fig. 3. Stretching device of Kammrath & Weiss[34]
Fig. 4. Piezoelectric driven medium and low frequency tensile fatigue testing device[39]
Fig. 5. Ultrasonic fatigue SEM system[40]
Fig. 6. Deformation measurement of tensile samples[43]. (a) Schematic diagram of sample deformation;
Fig. 7. Biaxial tensile device[61]
Fig. 8. SEM-EBSD biaxial tensile device[62]
Fig. 9. Tensile-torsional in-situ testing setup[63]
Fig. 10. Tensile-bending in-situ testing setup[64]
Fig. 11. In-situ heating method[68]
Fig. 12. SEM/EBSD-compatible laser heating device[73]. (a) Schematic diagram of heating device;
Fig. 13. In-situ heating device[74]
Fig. 14. Heating device produced by Shimadzu Corporation, Japan[75]
Fig. 15. Hybrid heating unit[76]
Fig. 16. Schematic diagram of heating unit[77]
Fig. 17. High-temperature in-situ testing setup[80]
Fig. 18. Schematic diagram of internal structure of high-temperature heating module[81]
Fig. 19. EBSD-compatible in-situ high-temperature stretching device[82]
Fig. 20. SEM/EBSD in-situ low-temperature stretching device[87]
Fig. 21. Temperature measurement method of in-situ SEM low-temperature stretching device[88]
Fig. 22. In-situ variable temperature tensile loading device[91]
Fig. 23. In-situ high-temperature tensile testing of failure mechanisms of nickel-based high-temperature alloys at different temperatures[103]
Fig. 24. In-situ EBSD images of non-deformed high-temperature alloys[110]. (a) EBSD sampling areas; (b), (c), and (d) are IPF, KAM, and GND density maps in xz plane, respevtively; (e), (f), and (g) are IPF, KAM, and GND density maps in xy plane
Fig. 25. In-situ EBSD observation of grain growth at different annealing temperatures[113]
Fig. 26. SEM in-situ three-point bending different strain distribution with grain orientation superimposed[119].
Fig. 27. In-situ tensile microstructure characterization of high entropy alloy[120]. (a) EBSD plot of sample at 0% tensile strain; (b) SEM image of sample at 0% strain; (c) DIC plot of sample at 18% tensile strain; (d) SEM image of sample at 18% strain
Fig. 28. Physical picture of sample rod[125]
Fig. 29. TEM in-situ tensile fatigue device[131]
Fig. 30. Thermally actuated MEMS stretching device[132]
Fig. 31. Electrostatically driven TEM in-situ testing setup[135]
Fig. 32. Schematic diagram of electrostatically driven stretching device[136]
Fig. 33. Schematic diagram of TEM in-situ resistance heater[137]
Fig. 34. TEM high-temperature mechanical loading device[143]
Fig. 35. TEM in-situ MEMS heating device[144]
Fig. 36. Schematic diagram of TEM heating device[145]. (a) MEMS heating device; (b) MEMS heating temperature distribution
Fig. 37. XRD in-situ tensile experimental setup[168]
Fig. 38. Biaxial tensile device mounted on a synchrotron[169]
Fig. 39. Biaxial tensile/compression and low circumference fatigue experimental setup[170]
Fig. 40. Planar biaxial loading device[171]
Fig. 41. XRD-compatible in-situ biaxial device[172]
Fig. 42. In-situ XRD biaxial loading device[173]
Fig. 43. Synchrotron radiation XRD in-situ ultra-high temperature tensile testing device[174]
Fig. 44. Neutron in-situ measurement variable temperature uniaxial stretching device[175]
Fig. 45. Variable temperature ambient chamber[175]
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Table 1. Commercial in-situ mechanical properties testing devices
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Table 2. In-situ cryogenic devices
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Table 3. Summary of in-situ testing techniques for mechanical properties of materials
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