WANG Yuan, YI Wenshuang, MA Minshu. Study on CTE Mismatch Failure Analysis and Optimization of a Large Size CLCC Device[J]. Microelectronics, 2022, 52(3): 498

Search by keywords or author
- Microelectronics
- Vol. 52, Issue 3, 498 (2022)
Abstract

Set citation alerts for the article
Please enter your email address