High-Temperature Material Spectral Emissivity Measurement Technology Based on 800 mm Semi-Ellipsoidal Reflector

Yongxing Yang; Xinrui Wang; Beibei Chen; Hengrui Guan; Jinpeng Li; Jingyuan Zhang; Xinhua Lai; Jinbiao Zhao

doi:10.3788/AOS202242.0908001

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