Fig. 1. Layout of measuring devices. (a) Devices for measuring spectral emissivity of high-temperature materials; (b) 800 nm semi-ellipsoidal mirror

Fig. 2. Simulated ray-tracing diagrams. (a) 30°reflectivity measurement mode; (b) 60°reflectivity measurement mode; (c) 90°reflectivity measurement mode; (d) normal transmittance measurement mode

Fig. 3. Simulation result curves. (a) 30° reflectivity measurement curves; (b) 60° reflectivity measurement error curves; (c) 90° reflectivity measurement curves; (d) 30° reflectivity measurement error curves; (e) 60° reflectivity measurement curves; (f) 90° reflectivity measurement error curves

Fig. 4. 90° normal transmittance curves. (a) Measured value curves; (b) standard value curves

Fig. 5. Transmittance error curves of AlN

Fig. 6. Spectral emissivity and reflectivity of super black alloy material. (a) Emissivity; (b) reflectivity

Fig. 7. Actual measurement result curves. (a) Spectral emissivity curves of grass green sample; (b) spectral reflectivity curves of grass green sample; (c) relationship between transmittance of translucent material and wavelength; (d) standard deviation diagram of transmittance of translucent material

Fig. 8. Measurement results for alloy material. (a) Emissivity; (b) reflectivity

Fig. 9. Physical diagrams of alloy material. (a) Physical diagram of alloy material at medium-low temperature; (b) physical diagram of alloy material at high temperature

Fig. 10. Three-dimensional ray-tracing model diagrams. (a) Wireframe diagram of model; (b) physical diagram of model

Fig. 11. Two-dimensional irradiance distributions. (a) Irradiance distribution without structural factors; (b) irradiance distribution with structural factors

Table 1. Parameters of semi-ellipsoidal mirror

Table 2. Parameters of Ray tracing