Tang Jianjun, Liang Ting, Xiong Jijun, Wang Yong, Xue Chenyang, Zhang Wendong. Analysis of Stress-Testing Using Raman Spectra on Heteroepitaxy Si/GaN[J]. Laser & Optoelectronics Progress, 2010, 47(8): 83002
Abstract
Set citation alerts for the article
Please enter your email address