Speckle Quality Evaluation Based on Gray Level Co-Occurrence Matrix

Lu Chu; Bin Liu; Liang Xu; Zhiwei Li; Baofeng Zhang

doi:10.3788/LOP202158.0410019

Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 4 >Page 0410019 > Article

Laser & Optoelectronics Progress
Vol. 58, Issue 4, 0410019 (2021)

Speckle Quality Evaluation Based on Gray Level Co-Occurrence Matrix

Lu Chu^1、2, Bin Liu^1、2、*, Liang Xu^1、2、*, Zhiwei Li^1、2, and Baofeng Zhang^1、2

Author Affiliations

¹School of Electrical and Electronic Engineering, Tianjin University of Technology, Tianjin 300384, China

²Tianjin Key Laboratory for Control Theory & Applications in Complicated Systems, Tianjin 300384, China;

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DOI: 10.3788/LOP202158.0410019 Cite this Article Set citation alerts

Lu Chu, Bin Liu, Liang Xu, Zhiwei Li, Baofeng Zhang. Speckle Quality Evaluation Based on Gray Level Co-Occurrence Matrix[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410019 Copy Citation Text

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Lu Chu, Bin Liu, Liang Xu, Zhiwei Li, Baofeng Zhang. Speckle Quality Evaluation Based on Gray Level Co-Occurrence Matrix[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410019

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