• Acta Optica Sinica
  • Vol. 42, Issue 19, 1916002 (2022)
Xiaohang Sheng1、2, Shaodong Zhou1, Kelei Xi1, Qingqing Cheng1、*, and Yang Wang2、**
Author Affiliations
  • 1School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
  • 2Research Laboratory for High Density Optical Storage, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    DOI: 10.3788/AOS202242.1916002 Cite this Article Set citation alerts
    Xiaohang Sheng, Shaodong Zhou, Kelei Xi, Qingqing Cheng, Yang Wang. Multi-Order Refractive Index Thin-Film Flat Lens Based on Phase Change Materials[J]. Acta Optica Sinica, 2022, 42(19): 1916002 Copy Citation Text show less

    Abstract

    Phase change materials have good photothermal stability and are rewritable. As their optical properties change significantly after phase change, and the crystallization states of phase change materials can be precisely controlled by applying laser excitation with different parameters. Therefore, on the basis of different optical parameters of phase change materials in different crystallization states, a thin-film flat lens with a multi-order refractive index design is proposed. The typical phase change material Ge2Sb2Te5 is used as the optical modulation medium, and the crystallization state of the dielectric film is controlled discretely in multi-order and multi-region according to the phase constraints required by the focusing lens. Flat lenses with different numerical apertures are designed, and the focusing parameters of lenses are simulated by the finite-difference time-domain method and Zemax separately to verify the imaging performance of the lenses.
    Xiaohang Sheng, Shaodong Zhou, Kelei Xi, Qingqing Cheng, Yang Wang. Multi-Order Refractive Index Thin-Film Flat Lens Based on Phase Change Materials[J]. Acta Optica Sinica, 2022, 42(19): 1916002
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