• Journal of Semiconductors
  • Vol. 41, Issue 3, 032103 (2020)
S. J. Mukhopadhyay1, Prajukta Mukherjee2, Aritra Acharyya3, and Monojit Mitra1
Author Affiliations
  • 1Department of Electronics and Telecommunication Engineering, Indian Institute of Engineering Science and Technology, West Bengal – 711103, India
  • 2Department of Electrical Engineering, Cooch Behar Government Engineering College, West Bengal – 736170, India
  • 3Department of Electronics and Communication Engineering, Cooch Behar Government Engineering College, West Bengal – 736170, India
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    DOI: 10.1088/1674-4926/41/3/032103 Cite this Article
    S. J. Mukhopadhyay, Prajukta Mukherjee, Aritra Acharyya, Monojit Mitra. Influence of self-heating on the millimeter-wave and terahertz performance of MBE grown silicon IMPATT diodes[J]. Journal of Semiconductors, 2020, 41(3): 032103 Copy Citation Text show less
    (Color online) Variations of breakdown voltage of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) linear temperature coefficient of breakdown voltage, and (b) corresponding constant linear fitting parameter with operating frequency.
    Fig. 1. (Color online) Variations of breakdown voltage of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) linear temperature coefficient of breakdown voltage, and (b) corresponding constant linear fitting parameter with operating frequency.
    (Color online) Variations of avalanche zone voltage drop of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) linear temperature coefficient of avalanche zone voltage drop and (b) corresponding constant linear fitting parameter with operating frequency.
    Fig. 2. (Color online) Variations of avalanche zone voltage drop of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) linear temperature coefficient of avalanche zone voltage drop and (b) corresponding constant linear fitting parameter with operating frequency.
    (Color online) Variations of avalanche zone width of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) linear temperature coefficient of avalanche zone width and (b) corresponding constant linear fitting parameter with operating frequency.
    Fig. 3. (Color online) Variations of avalanche zone width of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) linear temperature coefficient of avalanche zone width and (b) corresponding constant linear fitting parameter with operating frequency.
    (Color online) Variations of avalanche resonance frequency of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) quadratic temperature coefficient, (b) linear temperature coefficient of avalanche resonance frequency and (c) corresponding constant fitting parameter with operating frequency.
    Fig. 4. (Color online) Variations of avalanche resonance frequency of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) quadratic temperature coefficient, (b) linear temperature coefficient of avalanche resonance frequency and (c) corresponding constant fitting parameter with operating frequency.
    (Color online) Variations of optimum frequency of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; the insets show (a) quadratic temperature coefficient, (b) linear temperature coefficient of optimum frequency and (c) corresponding constant fitting parameter with operating frequency.
    Fig. 5. (Color online) Variations of optimum frequency of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; the insets show (a) quadratic temperature coefficient, (b) linear temperature coefficient of optimum frequency and (c) corresponding constant fitting parameter with operating frequency.
    (Color online) Variations of peak negative conductance of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) quadratic temperature coefficient, (b) linear temperature coefficient of peak negative conductance and (c) corresponding constant fitting parameter with operating frequency.
    Fig. 6. (Color online) Variations of peak negative conductance of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) quadratic temperature coefficient, (b) linear temperature coefficient of peak negative conductance and (c) corresponding constant fitting parameter with operating frequency.
    (Color online) Variations of susceptance corresponding to the peak negative conductance of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) quadratic temperature coefficient, (b) linear temperature coefficient of susceptance corresponding to the peak negative conductance and (c) corresponding constant fitting parameter with operating frequency.
    Fig. 7. (Color online) Variations of susceptance corresponding to the peak negative conductance of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) quadratic temperature coefficient, (b) linear temperature coefficient of susceptance corresponding to the peak negative conductance and (c) corresponding constant fitting parameter with operating frequency.
    (Color online) Variations of RF power output of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) quadratic temperature coefficient, (b) linear temperature coefficient of RF power output and (c) corresponding constant fitting parameter with operating frequency.
    Fig. 8. (Color online) Variations of RF power output of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) quadratic temperature coefficient, (b) linear temperature coefficient of RF power output and (c) corresponding constant fitting parameter with operating frequency.
    (Color online) Variations of DC to RF conversion efficiency of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) quadratic temperature coefficient, (b) linear temperature coefficient of DC to RF conversion efficiency and (c) corresponding constant fitting parameter with operating frequency.
    Fig. 9. (Color online) Variations of DC to RF conversion efficiency of Si IMPATT sources operating at different mm-wave and THz frequencies with temperature; insets of the figure show (a) quadratic temperature coefficient, (b) linear temperature coefficient of DC to RF conversion efficiency and (c) corresponding constant fitting parameter with operating frequency.
    Variations of RF power output of Si IMPATT sources obtained from the large-signal simulation and experimental measurements[5, 18, 20] at 500 K with operating frequency; inset shows the variations of DC to RF conversion efficiency of the sources obtained from the large-signal simulation and experimental measurement[18] at 500 K with operating frequency.
    Fig. 10. Variations of RF power output of Si IMPATT sources obtained from the large-signal simulation and experimental measurements[5, 18, 20] at 500 K with operating frequency; inset shows the variations of DC to RF conversion efficiency of the sources obtained from the large-signal simulation and experimental measurement[18] at 500 K with operating frequency.
    fd(GHz) Wn(µm) Wp(µm) ND(1023 m–3) NA(1023 m–3) Nn+(1025 m–3) Np+(1025 m–3) J0(108 A/m2) Dj(µm)
    940.4000.3801.2001.2505.0002.7003.4035.0
    1400.2800.2451.8002.1005.0002.7005.8025.0
    2200.1800.1603.9504.5905.0002.70014.520.0
    3000.1320.1126.0007.3005.0002.70024.515.0
    5000.0720.07215.0016.205.0002.70055.010.0
    Table 1. Optimized design parameters.
    fd(GHz) VB (V) VA (V) xA (μm)
    (10–2 V/K) (V) ( 10–2 V/K) (V) (10–2μm/K) (μm)
    943.1758.4812.0945.8210.2882.082
    1402.4827.0071.7724.7110.2221.586
    2201.8244.7881.3563.7340.1560.975
    3001.4524.4531.1713.4820.1200.803
    5001.0013.9780.8443.5550.0660.571
    Table 2. Linear temperature coefficient and constant fitting parameter associated with DC parameters for the temperature range 300–550 K.
    fd(GHz) fa (GHz) fp (GHz) Gp (S/m2)
    (10–4 GHz/K2) (GHz/K) (GHz) (10–4 GHz/K2) (GHz/K) (GHz) (S/(m2·K2)) (104 S/(m2·K)) (106 S/m2)
    941.445–0.216124.332.595–0.357206.6171.72–6.5005.550
    1401.900–0.289167.754.499–0.569310.50141.24–12.44211.128
    2203.041–0.442256.005.772–0.766455.20287.81–26.23620.759
    3004.151–0.581327.987.670–1.005616.69422.28–38.18326.985
    5004.798–0.706431.2313.093–1.623983.081014.40–90.64190.544
    Table 3. Quadratic temperature coefficient, linear temperature coefficient and constant fitting parameter associated with large-signal parameters such as fa, fp and Gp for the temperature range of 300–550 K.
    fd(GHz) Bp (S/m2) PRF(mW) ηL (%)
    (S/(m2·K2)) (105 S/(m2·K)) (107 S/m2) (10–3 mW/K2) (mW/K) (mW) (10–5 %K–2) (%K–1) (%)
    94–206.192.151–1.910–2.2903.590–584.66–5.1580.0568–7.500
    140–399.274.397–3.531–2.0402.555–420.05–4.1850.0460–5.817
    220–1090.301.173–11.023–0.8301.461–232.86–2.6740.0300–3.858
    300–2156.802.367–22.985–0.6400.970–150.32–2.1010.0230–2.839
    500–5516.306.314–58.475–0.5000.616–97.89–1.6870.0170–2.269
    Table 4. Quadratic temperature coefficient, linear temperature coefficient and constant fitting parameter associated with large-signal parameters such as Bp, PRF and ηL for the temperature range of 300–550 K.
    S. J. Mukhopadhyay, Prajukta Mukherjee, Aritra Acharyya, Monojit Mitra. Influence of self-heating on the millimeter-wave and terahertz performance of MBE grown silicon IMPATT diodes[J]. Journal of Semiconductors, 2020, 41(3): 032103
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