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    Journals >Opto-Electronic Engineering >Volume 34 >Issue 8 >Page 15 > Article
    • Opto-Electronic Engineering
    • Vol. 34, Issue 8, 15 (2007)
    NETD test for the staring thermal imaging system
    [in Chinese]1、2, [in Chinese]1、2, and [in Chinese]1
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. NETD test for the staring thermal imaging system[J]. Opto-Electronic Engineering, 2007, 34(8): 15 Copy Citation Text show less
    References

    [1] Paul A.BELL,Carl W.HOOVER Jr,Stanley J.PRUCHNIC Jr.Standard NETD test procedure for FLIR systems with video outputs[J].SPIE,1993,1969:194-206.

    [8] Scott J.MILLER,Brian S.BACKER,Margaret KOHIN,et al.Test methods and technology for uncooled imaging systems[J].SPIE,2004,5407:30-38.

    [9] John A.D'AGOSTINO,Curtis M.WEBB.Three-dimensional analysis framework and measurement methodology for imaging system noise[J].SPIE,1991,1488:110-122.

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    [in Chinese], [in Chinese], [in Chinese]. NETD test for the staring thermal imaging system[J]. Opto-Electronic Engineering, 2007, 34(8): 15
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