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    Journals >Opto-Electronic Engineering >Volume 34 >Issue 8 >Page 15 > Article
    • Opto-Electronic Engineering
    • Vol. 34, Issue 8, 15 (2007)
    NETD test for the staring thermal imaging system
    [in Chinese]1、2, [in Chinese]1、2, and [in Chinese]1
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. NETD test for the staring thermal imaging system[J]. Opto-Electronic Engineering, 2007, 34(8): 15 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese]. NETD test for the staring thermal imaging system[J]. Opto-Electronic Engineering, 2007, 34(8): 15
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