[1] H. Wang, R. B. Dinwiddie, H. Maleki. IR imaging of integrated circuit power transistors during operation[C]. SPIE, 2002, 4710: 80～86

[2] He Xiaoqi, Fei Qingyu, Tool for semiconductor device and inactivation analysis-introduction of micro infrared imaging infraScope and ray radiation microscope EMM1630[J]. Electronic Product Reliability and Environmental Test,1996, (2): 58～59

[3] Alastair Trigg. Applications of infrared microscopy to IC and MEMS packaging[J]. IEEE Trans. Electron. Packaging Manufacturing, 2003, 26(3): 232～238

[4] Bai Tingzhu, Jin Weiqi. Principle and Technology of Opto-electronic Imaging[M]. Beijing: Beijing Institute of Technology Press, 2006, 33～35

[5] O. Legras, A. Crastes, J. L. Tissot. Low cost uncooled IRFPA and molded IR lenses for enhanced driver vision[C]. SPIE, 2005, 5663: 230～237

[6] Xing Suxia, Zhang Junjun, Chang Benkang et al.. The development and status of the uncooled infrared imaging[J]. Infrared and Laser Engineering, 2004, 33(5): 441～443

[7] Cheng Changhong, Yi Xinjian, Cheng Zuhai. Fabrication of 8-element linear vOx uncooled microbolometer IR detector array[J]. Chinese J. Lasers, 2001, 28(12): 1082～1084

[8] Gao Meijing, Jin Weiqi, Wang Xia et al.. Study on the noise equivalent temperature difference and noise equivalent eradiation difference mathematical models for micro thermal imaging systems[J]. Transactions of Beijing Institute of Technolog, 2007, 27(1): 50～54

[9] Gao Meijing, Jin Weiqi, Wang Xia. Thermal microscope imaging system for semiconductor device and IC invalidation analysis[C]. SPIE, 2008, 6621: 1～8

[10] Gao Meijing, Jin Weiqi. Digital thermal microscope for biomedical application[C]. 2007 IEEE/ICME International Conference on Complex Medical Engineering, 2007, 1875～1878

[11] Jean Fortin, Paul Chevere. Realization of fast microscanning device for infrared focal plane[J]. SPIE, 1996, 2743: 185～196

[12] Zhang Haitao, Zhao Dazun. Mathematics theory and realization of aliasing reduction in opto-electric imaging system using microscanning[J]. Acta Optica Sinica, 1999, 19(9): 1263～1258

[13] Zhang Haitao, Zhao Dazun. Quantitative analysis of aliasing effects in opto-electric imaging systems[J]. Acta Optica Sinica, 1999, 19(12): 1649～1654

[14] Wu Xinshe, Cai Yi. The optical microscan technology in the infrared staring imaging system[J]. Journal of Infrared and Millimeter Waves, 2007, 26(1): 177～181

[15] Patrick Vandewalle, Sabine S üsstrunk, Martin Vetterli. A frequency domain approach to registration of aliased images with application to super-resolution[J]. Eurasip Journal on Applied Signal Processing, 2006: 1～14

[16] Gao Meijing. Investigation of High Resolution Optical Microscanning Thermal Microscope Imaging System[D]. Beijing: Beijing Institute of Technology, 2008, 65～67