Thermal performance testing for high power light-emitting diode based on voltage-current characteristics with pulse injection

Wang Xin; Xu Yingjie; Fan Xianguang; Wang Haitao; Wu Jinglin; Zuo Yong

[1] Kwag D S, So S H, Baek S M. Study on thermal and structural stability of high power light-emitting diode lighting system[J]. Journal of Nanoscience and Nanotechnology, 2014, 14(5): 3564-3568.

[2] Jeong T, Park H J, Ju J W, et al. High efficiency in GaN blue light-emitting diode with>4-W output power at 3 A[J]. IEEE Photonics Technology Letters, 2014, 26(7): 649-652.

[3] Wang Hong, Zhang Xiaofan, Du Naifeng, et al. Reflector design method of integrated high-power LED light source[J]. Infrared and Laser Engineering, 2011, 40(7): 1282-1286. (in Chinese)

[4] Zhai Xuhua, Zhang Hongtao, Yi Fuchang, et al. Refractive/diffractive optical design of a long-focal-length uncooled LWIR thermal imager[J]. Infrared and Laser Engineering, 2008, 32(5): 847-849. (in Chinese)

[5] Xi Y, Xi J Q, Gessmann T, et al. Junction and carrier temperature measurements in deep-ultraviolet light-emitting diodes using three different methods[J]. Appl Phys Lett, 2005, 86(3): 031907.1-031907.3.

[6] Kirkus L, Kalceff W, Mccredie G. System for measuring the junction temperature of a light emitting diode immersed in liquid nitrogen[J]. Rev Sci Instrum, 2006, 77(4): 046107-046110.

[7] Xi Y, Schubert E F. Junction-temperature measurement in GaN ultraviolet light-emitting diodes using diode forward voltage method[J]. Appl Phys Letter, 2004, 85(12): 2163-2165.

[8] Sékely V, Bien T V. Fine structure of heat flow path in semiconductor devices: a measurement and identification method[J]. Solid State Electron, 1988, 31(9): 1363-1368.

[9] Zong Y Q, Ohno Y S. New practical method for measurement of high-power LEDS[C]//CIE Expert Symposium on Advances in Photometry and Colorimetry, 2008: 102-106.

[10] Wen Huaijiang, Mou Tongsheng. The measurement of LED junction temperature and thermal capacity using pulse current[J]. Opto-Electronic Engineering, 2010, 37(7): 53-59. (in Chinese)