• Laser & Optoelectronics Progress
  • Vol. 56, Issue 12, 121002 (2019)
Yongzhi Quan, Shuhui Gao*, Mengjing Yang, Xiaojia Jiang, and Xinlong He
Author Affiliations
  • School of Forensic Science, People's Public Security University of China, Beijing 100038, China
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    DOI: 10.3788/LOP56.121002 Cite this Article Set citation alerts
    Yongzhi Quan, Shuhui Gao, Mengjing Yang, Xiaojia Jiang, Xinlong He. USM Sharpening Image Detection Based on Local Binary Pattern Method[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121002 Copy Citation Text show less
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    Yongzhi Quan, Shuhui Gao, Mengjing Yang, Xiaojia Jiang, Xinlong He. USM Sharpening Image Detection Based on Local Binary Pattern Method[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121002
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