USM Sharpening Image Detection Based on Local Binary Pattern Method

Yongzhi Quan; Shuhui Gao; Mengjing Yang; Xiaojia Jiang; Xinlong He

doi:10.3788/LOP56.121002

Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 12 >Page 121002 > Article

Laser & Optoelectronics Progress
Vol. 56, Issue 12, 121002 (2019)

USM Sharpening Image Detection Based on Local Binary Pattern Method

Yongzhi Quan, Shuhui Gao^*, Mengjing Yang, Xiaojia Jiang, and Xinlong He

Author Affiliations

School of Forensic Science, People's Public Security University of China, Beijing 100038, China

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DOI: 10.3788/LOP56.121002 Cite this Article Set citation alerts

Yongzhi Quan, Shuhui Gao, Mengjing Yang, Xiaojia Jiang, Xinlong He. USM Sharpening Image Detection Based on Local Binary Pattern Method[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121002 Copy Citation Text

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Yongzhi Quan, Shuhui Gao, Mengjing Yang, Xiaojia Jiang, Xinlong He. USM Sharpening Image Detection Based on Local Binary Pattern Method[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121002

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