• Infrared and Laser Engineering
  • Vol. 44, Issue 8, 2321 (2015)
Shi Dongping*, Wu Chao, Li Zijun, and Pan Wei
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    Shi Dongping, Wu Chao, Li Zijun, Pan Wei. Analysis of the influence of infrared temperature measurement based on reflected temperature compensation and incidence temperature compensation[J]. Infrared and Laser Engineering, 2015, 44(8): 2321 Copy Citation Text show less
    References

    [1] ASTM E1862-1997. Standard practice for measuring and compensating for reflected temperature using infrared imaging radiometers [S]. 2014.

    [2] Zhang Jian, Yang Li, Liu Huikai. Effect of environmental object on infrared temparature measurement[J]. Infrared Technology, 2005, 27(5): 419-422. (in Chinese)

    [3] Yang Zhen, Yang Li. Calculation and error analysis of infrared temperature measurement using reflected temperature compensation[J]. Opticval Technique, 2008, 34(Sl): 154-159. (in Chinese)

    [4] Li Zijun, Shi Dongping, Wu Chao, et al. Infrared thermography for prediction of spontaneous combustion of sulfide ores [J]. Transactions of Nonferrous Metals Society of China, 2012, 22: 3095-3101.

    [5] Yang Zhen, Zhang Shicheng, Yang Li. Reflected temperature compensation method and its experimental verification[J].Opticsa and Precision Engineering, 2010, 18(9): 1959-1964. (in Chinese)

    [6] Tian Changhui, Yang Baiyu, Cai Ming, et al. Effect of atmospheric background on infrared target detection[J].Infrared and Laser Engineering, 2014, 43(2): 439-441. (in Chinese)

    [7] Fan Jinxiang, Yang Jianyu. Development trends of infrared imaging detecting technology[J]. Infrared and Laser Engineering, 2012, 41(12): 3145-3152. (in Chinese)

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    Shi Dongping, Wu Chao, Li Zijun, Pan Wei. Analysis of the influence of infrared temperature measurement based on reflected temperature compensation and incidence temperature compensation[J]. Infrared and Laser Engineering, 2015, 44(8): 2321
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