• Infrared and Laser Engineering
  • Vol. 44, Issue 8, 2321 (2015)
Shi Dongping*, Wu Chao, Li Zijun, and Pan Wei
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    Shi Dongping, Wu Chao, Li Zijun, Pan Wei. Analysis of the influence of infrared temperature measurement based on reflected temperature compensation and incidence temperature compensation[J]. Infrared and Laser Engineering, 2015, 44(8): 2321 Copy Citation Text show less

    Abstract

    Based on the basic theory of infrared radiation and principles of temperature measurement using infrared imager, two methods of temperature compensation were proposed, reflected temperature compensation and incidence temperature compensation, in order to ensure environmental temperature object has less of an effect on infrared measurement. The theoretical analysis proved its feasibility and the operation program was put forward and used in production. The compensation measurements were demonstrated in a laboratory experiment with four sulfide ore samples. The results show that the fitting of compensation measurement with true temperature is better than that of common infrared measurement. The fractional error of reflected compensation measurement significantly is less than the incidence. The theoretical analysis and experiment result indicate the feasibility of the proposed methods. The compensation measurements ensure the measurement accuracy as well as expand the scope of common thermal infrared imager application and ensure the numerical accuracy of infrared prediction in the spontaneous combustion of sulfide ores.
    Shi Dongping, Wu Chao, Li Zijun, Pan Wei. Analysis of the influence of infrared temperature measurement based on reflected temperature compensation and incidence temperature compensation[J]. Infrared and Laser Engineering, 2015, 44(8): 2321
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