• Infrared and Laser Engineering
  • Vol. 52, Issue 8, 20230059 (2023)
Jingwen Yang1, Zonghua Zhang1,2, Lina Fu1, Yanling Li1,2..., Nan Gao1 and Feng Gao2|Show fewer author(s)
Author Affiliations
  • 1School of Mechanical Engineering, Hebei University of Technology, Tianjin 300130, China
  • 2Centre for Precision Technology, University of Huddersfield, Huddersfield HD13DH, UK
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    DOI: 10.3788/IRLA20230059 Cite this Article
    Jingwen Yang, Zonghua Zhang, Lina Fu, Yanling Li, Nan Gao, Feng Gao. Depth range enhancement of three-dimensional profiling measurement technology based on dithering algorithms[J]. Infrared and Laser Engineering, 2023, 52(8): 20230059 Copy Citation Text show less
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    Jingwen Yang, Zonghua Zhang, Lina Fu, Yanling Li, Nan Gao, Feng Gao. Depth range enhancement of three-dimensional profiling measurement technology based on dithering algorithms[J]. Infrared and Laser Engineering, 2023, 52(8): 20230059
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