[2] Canham L T. Appl. Phys. Lett., 1990, 57: 1046.
[3] Chen L Y, Chen W H, Hong F Chau-Nan. Appl. Phys. Lett., 2005, 86: 193506.
[4] Pei Z, Chang Y R, Hwang H L. Appl. Phys. Lett., 2002, 80: 2839.
[5] Shimizu-Iwayama T, Fujita K, Nakao S, et al. J. Appl. Phys., 1994, 75: 7779.
[6] Nishikawa H, Watanabe E, Ito D, et al. J. Appl. Phys., 1995, 78: 842.
[7] Pei Z, Hwang H L. Appl. Surf. Sci., 2003, 212/213: 760.
[8] Wan Y M, Buffet N. Solid-State Electron, 2004, 48: 1519.
[9] Gritsenko V A, Zhuravlev K S, Milov A D, et al. Thin Solid Films, 1999, 353: 20.
[12] Wang Y Q, Wang Y G, et al. Appl. Phys. Lett. , 2003, 83: 3474.
[13] Zerga A, Carrada M, Amann M. Physica E, 2007, 38: 21.
[14] Rinnert H, Vergnat M, Marchal G, et al. Appl. Phys. Lett., 1998, 72: 3157.
[15] Chen Kunji, Ma Zhongyuan. Journal of Non-Crystalline Solids, 2004, 338: 448.
[16] Wainstein D L, Kovalev A I, Ducso Cs. Physica E, 2007, 38: 156.
[17] Park N M, Kim T S, Park S J. Appl. Phys. Lett., 2001, 78: 2575.
[18] Mo C M, Zhang L, Xie C, et al. J. Appl. Phys., 1993, 73: 5185.
[19] Drínek Vladislav, Pola Josef, Bastl Zdeněk, et al. J. Non-Cryst. Solids, 2001, 288: 30.
[20] Sen P N, Thorpe M F. Phys. Rev. B, 1977, 15(8): 4030.