• Journal of Infrared and Millimeter Waves
  • Vol. 43, Issue 1, 15 (2024)
Miao He1、2, Yi Zhou1、2、3、*, Xiang-Xiao Ying2, Zhao-Min Liang2, Min Huang2, Zhi-Fang Wang1、2, Yi-Hong Zhu2, Ke-Cai Liao2, Nan Wang2, and Jian-Xin Chen2、3
Author Affiliations
  • 1University of Shanghai for Science and Technology,Shanghai 200433
  • 2Shanghai Institute of Technical Physics,Shanghai 200083
  • 3School of Physics and Optoelectronic Engineering,Hangzhou Institute for Advanced Study,University of Chinese Academy of Sciences,Hangzhou 310024
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    DOI: 10.11972/j.issn.1001-9014.2024.01.003 Cite this Article
    Miao He, Yi Zhou, Xiang-Xiao Ying, Zhao-Min Liang, Min Huang, Zhi-Fang Wang, Yi-Hong Zhu, Ke-Cai Liao, Nan Wang, Jian-Xin Chen. Si Ion Implantation Study of InAs/GaSb Type II superlattice Materials[J]. Journal of Infrared and Millimeter Waves, 2024, 43(1): 15 Copy Citation Text show less
    References

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    Miao He, Yi Zhou, Xiang-Xiao Ying, Zhao-Min Liang, Min Huang, Zhi-Fang Wang, Yi-Hong Zhu, Ke-Cai Liao, Nan Wang, Jian-Xin Chen. Si Ion Implantation Study of InAs/GaSb Type II superlattice Materials[J]. Journal of Infrared and Millimeter Waves, 2024, 43(1): 15
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