• Laser & Optoelectronics Progress
  • Vol. 56, Issue 11, 112801 (2019)
Wenxiu Teng1、**, Ni Wang2、3、*, Taisheng Chen2、3, Benlin Wang2、3、4, Menglin Chen2、3, and Huihui Shi3
Author Affiliations
  • 1 College of Forest, Nanjing Forestry University, Nanjing, Jiangsu 210037, China
  • 2 School of Geographic Information and Tourism, Chuzhou University, Chuzhou, Anhui 239000, China
  • 3 Anhui Engineering Laboratory of Geographical Information Intelligent Sensor and Service, Chuzhou, Anhui 239000, China
  • 4 School of Earth Sciences and Engineering, Hohai University, Nanjing, Jiangsu 210098, China
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    DOI: 10.3788/LOP56.112801 Cite this Article Set citation alerts
    Wenxiu Teng, Ni Wang, Taisheng Chen, Benlin Wang, Menglin Chen, Huihui Shi. Deep Adversarial Domain Adaptation Method for Cross-Domain Classification in High-Resolution Remote Sensing Images[J]. Laser & Optoelectronics Progress, 2019, 56(11): 112801 Copy Citation Text show less

    Abstract

    In this study, a deep adversarial domain adaptation method is proposed for cross-domain classification in high-resolution remote sensing images. A deep convolutional neural network VGG16 is used to learn the deep features of scene images. The adversarial learning method is used to minimize the difference of feature distribution between source and target domains. RSI-CB256(Remote Sensing Image Classification Benchmark), NWPU-RESISC45(Northwestern Polytechnical University Remote Sensing Image Scene Classification)and AID(Aerial Image data set) are used as source domain datasets, and UC-Merced(University of California, Merced)and WHU-RS 19(Wuhan University Remote Sensing)are used as target domain datasets. The experimental results denote that the proposed method can improve the generalization ability of the model for target domain dataset without labels.
    Wenxiu Teng, Ni Wang, Taisheng Chen, Benlin Wang, Menglin Chen, Huihui Shi. Deep Adversarial Domain Adaptation Method for Cross-Domain Classification in High-Resolution Remote Sensing Images[J]. Laser & Optoelectronics Progress, 2019, 56(11): 112801
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