• Journal of Applied Optics
  • Vol. 45, Issue 5, 1072 (2024)
Yongbo XU1,2, Yunzhe WANG1,2, Changbin ZHENG1, Yang LIU1..., Xiangzheng CHENG3 and Junfeng SHAO1,*|Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory of Laser Interaction with Matter, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Key Laboratory of Electro-Optic Countermeasures Test & Evaluation Technology, Luoyang Electronic Equipment Test Center of China, Luoyang 471003, China
  • show less
    DOI: 10.5768/JAO202445.0507003 Cite this Article
    Yongbo XU, Yunzhe WANG, Changbin ZHENG, Yang LIU, Xiangzheng CHENG, Junfeng SHAO. Experimental study on back-illuminated CMOS image sensor irradiated by CW laser[J]. Journal of Applied Optics, 2024, 45(5): 1072 Copy Citation Text show less
    References

    [1] Ming SHAO, Leilei ZHANG, Wei ZHAO et al. Experiment study on saturation effect of high-repetition-rate laser jamming CMOS camera. Laser Journal, 34, 16-17(2013).

    [2] Liang SHENG, Zhen ZHANG, Jianmin ZHANG et al. Experimental study on a visible light CMOS camera irradiated by 632.8 nm CW laser. Modern Applied Physics, 6, 181-185(2015).

    [3] Jingnan WANG, Jinsong NIE. Experimental study on supercontinuum laser irradiating a visible light CMOS imaging sensor. Infrared and Laser Engineering, 46, 0106004(2017).

    [4] Ming SHAO, Le ZHANG, Leilei ZHANG et al. Comparative study on saturation effect of 1.06 μm laser jamming CCD and CMOS cameras. Journal of Applied Optics, 35, 163-167(2014).

    [5] Liang SHENG, Zhen ZHANG, Jianmin ZHANG et al. Pixel upset effect and mechanism of CW laser irradiated CMOS camera. Infrared and Laser Engineering, 45, 0606004(2016).

    [6] Xuanfeng ZHOU, Qianrong CHEN, Yanbin WANG et al. Image interrupt effect and mechanism of pulse laser irradiated CMOS camera. Infrared and Laser Engineering, 48, 0306002(2019).

    [7] Junyang LIN, Rong SHU, Genghua HUANG et al. Study on threshold of laser damage to ccd and cmos image sensors. Journal of Infrared and Millimeter Waves, 27, 475-478(2008).

    [8] Feng GUO. Comparative study on irradiation effect of laser on CMOS and CCD(2013).

    [9] Ang WANG, Feng GUO, Zhiwu ZHU et al. Comparative study of hard CMOS damage irradiated by CW laser and single-pulse ns laser. High Power Laser and Particle Beams, 26, 091007(2014).

    [10] Honggang XIANG. Study on some problems of strong light irradiation effect of CMOS area array detector(2020).

    [11] Peng LEI, Ke SUN, Hua LI et al. Experimental study on the change of cat eye echo pattern with laser damage of CMOS detector. Chinese Journal of Lasers, 43, 0601001(2016).

    [12] Xue WANG. Research on laser blinding and damage technology of photoelectric sensors(2018).

    [13] Mengzhen ZHU, Yun LIU, Chaowei MI et al. Experimental study on a CMOS image sensor damaged by a composite laser. Infrared and Laser Engineering, 51, 227-233.(2022).

    [14] Jiaqi WEN, Jintian BIAN, Xin LI et al. Research progress of laser dazzle and damage CMOS image sensor. Infrared and Laser Engineering, 52, 379-393.(2023).

    [15] F BARTOLI, L ESTEROWITZ, M KRUER et al. Irreversible laser damage in ir detector materials. Applied Optics, 16, 2934-2937(1977).

    [16] F BARTOLI, L ESTEROWITZ, R ALLEN et al. A generalized thermal model for laser damage in infrared detectors. Journal of Applied Physics, 47, 2875-2881(1976).

    [17] F BARTOLI, M KRUER, L ESTEROWITZ et al. Laser damage in triglycine sulfate: experimental results and thermal analysis. Journal of Applied Physics, 44, 3713-3720(1973).

    [18] Junfeng SHAO. Damage effect and mechanism of short pulse laser on silicon and silicon-based optoelectronic devices(2015).

    [19] Ang WANG. Study on laser irradiation effect of visible CMOS image sensor(2014).

    Yongbo XU, Yunzhe WANG, Changbin ZHENG, Yang LIU, Xiangzheng CHENG, Junfeng SHAO. Experimental study on back-illuminated CMOS image sensor irradiated by CW laser[J]. Journal of Applied Optics, 2024, 45(5): 1072
    Download Citation