• Journal of Applied Optics
  • Vol. 45, Issue 5, 1072 (2024)
Yongbo XU1,2, Yunzhe WANG1,2, Changbin ZHENG1, Yang LIU1..., Xiangzheng CHENG3 and Junfeng SHAO1,*|Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory of Laser Interaction with Matter, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Key Laboratory of Electro-Optic Countermeasures Test & Evaluation Technology, Luoyang Electronic Equipment Test Center of China, Luoyang 471003, China
  • show less
    DOI: 10.5768/JAO202445.0507003 Cite this Article
    Yongbo XU, Yunzhe WANG, Changbin ZHENG, Yang LIU, Xiangzheng CHENG, Junfeng SHAO. Experimental study on back-illuminated CMOS image sensor irradiated by CW laser[J]. Journal of Applied Optics, 2024, 45(5): 1072 Copy Citation Text show less
    Structure diagram of CMOS image sensor
    Fig. 1. Structure diagram of CMOS image sensor
    Experimental schematic diagram of laser illumination on CMOS image sensor
    Fig. 2. Experimental schematic diagram of laser illumination on CMOS image sensor
    Experimental site of laser illumination on CMOS image sensor
    Fig. 3. Experimental site of laser illumination on CMOS image sensor
    Light spot of the first interference experiment
    Fig. 4. Light spot of the first interference experiment
    Interference experiment 1
    Fig. 5. Interference experiment 1
    Light spot of the second interference experiment
    Fig. 6. Light spot of the second interference experiment
    Interference experiment 2
    Fig. 7. Interference experiment 2
    Fitting curves of power density and saturated pixel number
    Fig. 8. Fitting curves of power density and saturated pixel number
    Experiment 1
    Fig. 9. Experiment 1
    Damage morphology of different stages
    Fig. 10. Damage morphology of different stages
    指标参数
    传感器型号Sony IMX178
    像元尺寸2.4 µm×2.4 µm
    靶面尺寸1/1.8′′
    分辨率3 072×2 048像素
    黑白/彩色黑白
    Table 1. Parameters table of back-illuminated CMOS detector
    型号结构饱和阈值过饱和阈值饱和串扰
    Micron MT9V022前照式5.87×10−36.0×1022.0×103
    Sony IMX178背照式1.39×10−21.49×104
    Table 2. Interference threshold comparison W/cm2
    型号结构辐照 时间点损伤十字线 损伤面损伤致盲
    Micron MT9V022前照式1 s1.12×105
    400 ms1.62×1051.93×105
    Sony IMX178背照式1 s1.35×1061.74×1061.65×1072.27×107
    Table 3. Damage threshold comparison W/cm2
    Yongbo XU, Yunzhe WANG, Changbin ZHENG, Yang LIU, Xiangzheng CHENG, Junfeng SHAO. Experimental study on back-illuminated CMOS image sensor irradiated by CW laser[J]. Journal of Applied Optics, 2024, 45(5): 1072
    Download Citation