• Acta Optica Sinica
  • Vol. 17, Issue 5, 599 (1997)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of Response of Film 5F to Soft-X-Ray[J]. Acta Optica Sinica, 1997, 17(5): 599 Copy Citation Text show less
    References

    [2] K. Eidmann, T. Kishimoto et al.. Absolute soft X-ray measurements with a transmission grating spectrometer. Laser and Particle Beams, 1986, 4(3/4): 521~530

    [4] B. L. Henke et al.. Low-energy X-ray response of photographic films. I. Mathematical models. J. Opt. Soc. Am. (B), 1984, 1(6): 818~827

    [5] B. L. Henke et al.. Low-energy X-ray response of photographic films. II. Experimental characterization. J. Opt. Soc. Am. (B), 1984, 1(6): 828~849

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of Response of Film 5F to Soft-X-Ray[J]. Acta Optica Sinica, 1997, 17(5): 599
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