Study of Response of Film 5F to Soft-X-Ray

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 17 >Issue 5 >Page 599 > Article

Acta Optica Sinica
Vol. 17, Issue 5, 599 (1997)

Study of Response of Film 5F to Soft-X-Ray

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of Response of Film 5F to Soft-X-Ray[J]. Acta Optica Sinica, 1997, 17(5): 599 Copy Citation Text

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Abstract

A mathematical model was introduced to determine the optical density of film 5F as a function of low energy X ray exposure and its wavelength. Parameters in the model were determined by experimental response curves for film 5F at energy of 183 eV and 933 eV. Validity of the model and its parameters were checked by experimental response curve at energy of 288 eV.

Keywords

mathematical model optical desity response curve X-ray exposure film 5F

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of Response of Film 5F to Soft-X-Ray[J]. Acta Optica Sinica, 1997, 17(5): 599

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