• Chinese Journal of Quantum Electronics
  • Vol. 20, Issue 4, 501 (2003)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Preliminary Experimental Study on the Resolution of the Optical-electro Imaging System at 30.4 nm[J]. Chinese Journal of Quantum Electronics, 2003, 20(4): 501 Copy Citation Text show less
    References

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    [2] Kenter A, Chappell J H, Kraft R, et al. In-flight performance and calibration of the chandra high resolution camera imager [C] //Proc. SPIE, 2000, 4012:467-489

    [3] Grantham S, Miesak E, Reese P, et al. Optimal MCP configuration for use in high speed, high resolution X-ray imaging [C] // Proc. SPIE, 1994, 2273:108-117

    [4] Vallerga J V, et al. Six years in orbit: the MCP detectors aboard the extreme ultraviolet explorer satellite [C]//Proc. SPIE, 1998, 3356:1001-1010

    [5] Dicicco D S, Kim D, Rosser R, et al. First stage in the development of a soft- x-ray reflection imaging microscopein the Schwarzschild configuration using a soft-x-ray laser at 18.2 nm [J]. Opt. Lett, 1992, 17(2): 157-159

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Preliminary Experimental Study on the Resolution of the Optical-electro Imaging System at 30.4 nm[J]. Chinese Journal of Quantum Electronics, 2003, 20(4): 501
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