. A 128-member binary library^[15]

. Schematic diagram of combinatorial electrostatic atomization system “M-ist Combi”^[16]

. Schematic illustration for the Czochralski crystal growth^[18]

. Schematic illustration for the vertical Bridgman crystal growth^[19]

. Variation of Seebeck coefficient values along n-type 0.01/0.055% PbI₂ doped (Pb_0.95Sn_0.05Te)_0.92(PbS)_0.08 functionally graded materials^[24]

. (a) Scheme of a rotor with capsules for sedimentation experiment and (b) mechanism of sedimentation of atoms in the strong acceleration field^[25]

. (a) Optical image of the annealed Ti-Ni-Sn thin film materials library; (b-d) color-coded results of the high-throughput EDX measurements of the material library^[27]

. EDX measurements of the concentration of (a)magnesium, (b)nickel and (c)aluminum of an Mg-Ni-Al ternary thin film library^[30]

. Layout of the nanocalorimeter cell^[34]

. Composition trends over the sample library, (a) Si:Cu ratio for the glass-forming component, (b) glass transition temperature and (c) the total enthalpy of this glass reaction^[35]

. (a) Schematic of the pump and probe laser measurement setup and (b)temperature increase as a function of time after a single-pulse^[33]

. Time-domain thermoreflectance experimental setup^[33]

. (a)Thermal conductivity imaging of a Cr-Ti diffusion couple and (b) numerical values for thermal conductivity across the path shown as a dashed line in (a)^[40]

. Schematic illustration of SThM setup^[43]

. Quantitative mapping of thermal conductivities, (a) changes in the probe resistance induced by samples with different thermal conductivities; Mappings of (b) resistance change and (c) corresponding thermal conductivities in Yb_0.7Co₄Sb₁₂; (d) Line scan of resistance change across an interface between different phases^[45]

. (a) SEM image, (b) AFM topography image, and (c) thermal map image obtained with the SThM technique are shown simultaneously for the same area of the Ag₂Se thin film^[46]

. A photograph of the high temperature thermoelectric power factor screening tool and the Seebeck coefficient probe^[14]

. Schematics of PSM setup^[48]

. Thermopower mappings with different thicknesses grown on Si/Au(a)and quartz/Au(b) substrates^[49]

. Seebeck coefficient distribution of the Bi₂Te₂Se sample with composition gradient^[50]

. Schematic diagram of the AFM conductive, heated probe technique for nanoscale Seebeck coefficient characterization^[52]

. (a) AFM topography image of Bi₂Te₃ thin film with 49 locations for nanoscale and (b) Seebeck voltage measurement, as indication by 49 dots in (a)^[52]