• Laser & Optoelectronics Progress
  • Vol. 57, Issue 11, 111408 (2020)
Zhiquan Cui1 and Yingchun Guan1、2、3、4、*
Author Affiliations
  • 1School of Mechanical Engineering & Automation, Beihang University, Beijing 100191, China;
  • 2National Engineering Laboratory of Addictive Manufacturing for Large Metallic Components, Beihang University, Beijing 100191, China
  • 3International Research Institute for Multidiscipline Science, Beihang University, Beijing 100191, China
  • 4Hefei Innovation Research Institute of Beihang University, Hefei, Anhui 230013, China
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    DOI: 10.3788/LOP57.111408 Cite this Article Set citation alerts
    Zhiquan Cui, Yingchun Guan. Review of Numerical Models of Ultrafast Laser Processing[J]. Laser & Optoelectronics Progress, 2020, 57(11): 111408 Copy Citation Text show less
    Comparison of laser beam propagation intensity in focal region[22]. (a) Before improvement; (b) after improvement
    Fig. 1. Comparison of laser beam propagation intensity in focal region[22]. (a) Before improvement; (b) after improvement
    Simulated 3D ablation craters by single pulses with different laser intensities[41]. (a) 2 J/cm2; (b) 5 J/cm2; (c) 8 J/cm2
    Fig. 2. Simulated 3D ablation craters by single pulses with different laser intensities[41]. (a) 2 J/cm2; (b) 5 J/cm2; (c) 8 J/cm2
    Snapshot of ablation plume, and obvious differences in plume structure[42]
    Fig. 3. Snapshot of ablation plume, and obvious differences in plume structure[42]
    Ablation mechanism changes with material depth and laser intensity[43]
    Fig. 4. Ablation mechanism changes with material depth and laser intensity[43]
    Spatial and temporal distributions of phase states of different ablation metals with HD method. (a) Copper[45]; (b) aluminum[34]; (c) nickel[44]; (d) gold[46]
    Fig. 5. Spatial and temporal distributions of phase states of different ablation metals with HD method. (a) Copper[45]; (b) aluminum[34]; (c) nickel[44]; (d) gold[46]
    Relationship between ablation depth of aluminum and laser fluence(comparison between experimental data and HD simulation data)[48]
    Fig. 6. Relationship between ablation depth of aluminum and laser fluence(comparison between experimental data and HD simulation data)[48]
    Pressure and density near spallation threshold Fs=193 mJ/cm2[49]. (a) Pressure; (b) density
    Fig. 7. Pressure and density near spallation threshold Fs=193 mJ/cm2[49]. (a) Pressure; (b) density
    Calculated total laser absorption by plume as a function of laser intensity[56]
    Fig. 8. Calculated total laser absorption by plume as a function of laser intensity[56]
    Absorption of the first (blue squares) and the second (red circles) pulses by plasma plumes as a function of delay between them. Intensity of each pulse is 2 J/cm2[57]
    Fig. 9. Absorption of the first (blue squares) and the second (red circles) pulses by plasma plumes as a function of delay between them. Intensity of each pulse is 2 J/cm2[57]
    Simulation results obtained for linear polarization with intensity of 1010 W/cm2 after 10 fs[69].(a) Electronic density profile; (b) electrical field profile
    Fig. 10. Simulation results obtained for linear polarization with intensity of 1010 W/cm2 after 10 fs[69].(a) Electronic density profile; (b) electrical field profile
    Simulation results obtained for circular polarization with intensity of 1010 W/cm2 after 10 fs[69].(a) Electronic density profile; (b) electrical field profile
    Fig. 11. Simulation results obtained for circular polarization with intensity of 1010 W/cm2 after 10 fs[69].(a) Electronic density profile; (b) electrical field profile
    Formation of liquid walls during ablation[73]
    Fig. 12. Formation of liquid walls during ablation[73]
    Schematics of electromagnetic and hydrodynamic coupling processes upon multipulse femtosecond laser irradiation[74]
    Fig. 13. Schematics of electromagnetic and hydrodynamic coupling processes upon multipulse femtosecond laser irradiation[74]
    Zhiquan Cui, Yingchun Guan. Review of Numerical Models of Ultrafast Laser Processing[J]. Laser & Optoelectronics Progress, 2020, 57(11): 111408
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