Qiuhui Zhuang, Sanqiang Wang. Three-Wavelength High-Reflectivity Film for All-Solid-State 355-nm Ultraviolet Laser[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1924002
- Laser & Optoelectronics Progress
- Vol. 58, Issue 19, 1924002 (2021)
Fig. 1. Spectral curve of membrane system
Fig. 2. Test spectral curve of thin film
Fig. 3. Laser damage threshold of different substrate materials and cleaning process
Fig. 4. Damage morphology under different working vacuum. (a) 7×10-3 Pa; (b) 9×10-3 Pa; (c) 2×10-2 Pa; (d) 3×10-2 Pa
Fig. 5. Weak absorption values of film samples under different working vacuum
Fig. 6. Laser damage threshold of thin film samples under different working vacuum
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Table 1. Method for preparing group Ⅰ samples
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Table 2. Method for preparing group Ⅱ samples
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