Measurement of Lens-Center Thickness Based on Low-Coherence Interference with Transmitted Illumination

Jingyou Liu; Feng Lei

doi:10.3788/LOP56.121201

Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 12 >Page 121201 > Article

Laser & Optoelectronics Progress
Vol. 56, Issue 12, 121201 (2019)

Measurement of Lens-Center Thickness Based on Low-Coherence Interference with Transmitted Illumination

Jingyou Liu^1、2、* and Feng Lei^1、2

Author Affiliations

¹ School of Physics and Electronic Electrical Engineering, Huaiyin Normal University, Huai'an, Jiangsu 223300, China

² Key Laboratory of Huai'an's Micro-Nano Optical Imaging, Huai'an, Jiangsu 223300, China

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DOI: 10.3788/LOP56.121201 Cite this Article Set citation alerts

Jingyou Liu, Feng Lei. Measurement of Lens-Center Thickness Based on Low-Coherence Interference with Transmitted Illumination[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121201 Copy Citation Text

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Jingyou Liu, Feng Lei. Measurement of Lens-Center Thickness Based on Low-Coherence Interference with Transmitted Illumination[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121201

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