• Laser & Optoelectronics Progress
  • Vol. 47, Issue 11, 110501 (2010)
Shi Chunying*, Qian Jin, Tan Huiping, Liu Xiuying..., Liu Zhongyou, Yin Cong and Cai Shan|Show fewer author(s)
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    DOI: 10.3788/lop47.110501 Cite this Article Set citation alerts
    Shi Chunying, Qian Jin, Tan Huiping, Liu Xiuying, Liu Zhongyou, Yin Cong, Cai Shan. Results from National Institute of Metrology in NANO5 2D Grating Comparison[J]. Laser & Optoelectronics Progress, 2010, 47(11): 110501 Copy Citation Text show less
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    Shi Chunying, Qian Jin, Tan Huiping, Liu Xiuying, Liu Zhongyou, Yin Cong, Cai Shan. Results from National Institute of Metrology in NANO5 2D Grating Comparison[J]. Laser & Optoelectronics Progress, 2010, 47(11): 110501
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