Researching | Results from National Institute of Metrology in NANO5 2D Grating Comparison

Journals >Laser & Optoelectronics Progress >Volume 47 >Issue 11 >Page 110501 > Article

Laser & Optoelectronics Progress
Vol. 47, Issue 11, 110501 (2010)

Results from National Institute of Metrology in NANO5 2D Grating Comparison

Shi Chunying^*, Qian Jin, Tan Huiping, Liu Xiuying, Liu Zhongyou, Yin Cong, and Cai Shan

Author Affiliations

[in Chinese]

show less

DOI: 10.3788/lop47.110501 Cite this Article Set citation alerts

Shi Chunying, Qian Jin, Tan Huiping, Liu Xiuying, Liu Zhongyou, Yin Cong, Cai Shan. Results from National Institute of Metrology in NANO5 2D Grating Comparison[J]. Laser & Optoelectronics Progress, 2010, 47(11): 110501 Copy Citation Text

show less

Cited By

Article index updated: May. 18, 2024

Citation counts are provided from Researching.

The article is cited by 1 article(s) from Researching.

Get PDF(in Chinese)

Figures&Tables (0)

References (12)

Copy Citation Text

Shi Chunying, Qian Jin, Tan Huiping, Liu Xiuying, Liu Zhongyou, Yin Cong, Cai Shan. Results from National Institute of Metrology in NANO5 2D Grating Comparison[J]. Laser & Optoelectronics Progress, 2010, 47(11): 110501

Download Citation

Set citation alerts for the article

Set citation alerts for the article

Save the article for my favorites

Paper Information

Recommended Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology

Set citation alerts for the article

Please enter your email address