Extended transient-grating self-referenced spectral interferometry for sub-100 nJ femtosecond pulse characterization

Xiong Shen; Jun Liu; Fangjia Li; Peng Wang; Ruxin Li

doi:10.3788/COL201513.081901

Journals >Chinese Optics Letters >Volume 13 >Issue 8 >Page 081901 > Article

Chinese Optics Letters
Vol. 13, Issue 8, 081901 (2015)

Extended transient-grating self-referenced spectral interferometry for sub-100 nJ femtosecond pulse characterization

Xiong Shen¹, Jun Liu^1、2、*, Fangjia Li^1、3, Peng Wang¹, and Ruxin Li^1、2

Author Affiliations

¹State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai 200240, China

³Tongji University, Shanghai 200092, China

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DOI: 10.3788/COL201513.081901 Cite this Article Set citation alerts

Xiong Shen, Jun Liu, Fangjia Li, Peng Wang, Ruxin Li. Extended transient-grating self-referenced spectral interferometry for sub-100 nJ femtosecond pulse characterization[J]. Chinese Optics Letters, 2015, 13(8): 081901 Copy Citation Text

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Abstract

A geometry of transient-grating self-referenced spectral interferometry (TG-SRSI) is proposed for weak femtosecond pulse characterization. By using a reflective microscope objective (RMO), we build a compact, robust, and easy to adjust device with a higher sensitivity to pulse energy in comparison to all previous SRSI methods. A

65 nJ / ～ 40 fs / 1 kHz

pulse at 800 nm is successfully characterized, which speaks to the capability of our device to characterize a weak pulse. It is expected to extend the TG-SRSI method to the characterization of femtosecond pulses from oscillators in the near future.