Fast Three-Dimensional Measurement Based on Three Channel Binary Fringe Defocused Projection

Xin Zhang; Shaoyan Gai; Feipeng Da

doi:10.3788/LOP57.231201

Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 23 >Page 231201 > Article

Laser & Optoelectronics Progress
Vol. 57, Issue 23, 231201 (2020)

Fast Three-Dimensional Measurement Based on Three Channel Binary Fringe Defocused Projection

Xin Zhang^1、2, Shaoyan Gai^1、2、*, and Feipeng Da^1、2

Author Affiliations

¹School of Automation, Southeast University, Nanjing, Jiangsu 210096, China

²Key Laboratory of Measurement and Control of CSE, Ministry of Education, Southeast University, Nanjing, Jiangsu 210096, China

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DOI: 10.3788/LOP57.231201 Cite this Article Set citation alerts

Xin Zhang, Shaoyan Gai, Feipeng Da. Fast Three-Dimensional Measurement Based on Three Channel Binary Fringe Defocused Projection[J]. Laser & Optoelectronics Progress, 2020, 57(23): 231201 Copy Citation Text

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Xin Zhang, Shaoyan Gai, Feipeng Da. Fast Three-Dimensional Measurement Based on Three Channel Binary Fringe Defocused Projection[J]. Laser & Optoelectronics Progress, 2020, 57(23): 231201

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