• Opto-Electronic Engineering
  • Vol. 37, Issue 5, 52 (2010)
DAI Xiao-lei1、2、*, CAO Xue-dong1, YANG Wen-zhi1, and WU Shi-bin1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    DAI Xiao-lei, CAO Xue-dong, YANG Wen-zhi, WU Shi-bin. Flatness Measurement of Large Annular Planes Based on Three-point Method[J]. Opto-Electronic Engineering, 2010, 37(5): 52 Copy Citation Text show less
    References

    [1] CAO Xue-dong,FAN Tian-quan,WU Shi-bin,et al. Current developments of measurement techniques for geometry parameters [J]. Infrared and Laser Engineering,2008,37(5):884-889.

    [5] SUN Bao-shou,ZHANG Lei,ZHANG Yu. Imitation Calculation of Straightness Error with Three-Point Method [J]. JOURNAL OF NORTHEASTERN UNIVERSITY,1994,15(2):200-204.

    [6] YIN Zi-qiang,LI Sheng-yi,WANG Zhuo. High Precision Measurement of Straightness [J]. Computer Automated Measurement & Control,1998,19(1):106-112.

    [7] SUN Bao-shou,ZHAN Sheng-wang. Application research of measuring straightness errors with three- point method [J]. JOURNAL OF EAST CHINA UNIVERSITY OF METALLURGY,2000,17(3):217-220.

    [8] LI Ying-chun,ZHU Shan-jun,SUN Xin-ya. Research on 3-point relaying method used in dynamic measurement of straightness for large workpiece [J]. MANUFACTURING AUTOMATION,2006,28(12):16-19.

    [9] LI Zi-jun,HONG Mai-sheng,WEI Yuan-lei,et al. Accurate Frequency Domain Three-point Method for Straightness Error Separation [J]. MACHINE DESIGN AND RESEARCH,1990,54(6):23-29.

    CLP Journals

    [1] HE Wenyan, CAO Xuedong, KUANG Long, ZHANG Peng. A Preliminary Based on Structured-light for Flatness Measurement of Large Annular Planes[J]. Opto-Electronic Engineering, 2016, 43(11): 7

    DAI Xiao-lei, CAO Xue-dong, YANG Wen-zhi, WU Shi-bin. Flatness Measurement of Large Annular Planes Based on Three-point Method[J]. Opto-Electronic Engineering, 2010, 37(5): 52
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