• Opto-Electronic Engineering
  • Vol. 37, Issue 5, 52 (2010)
DAI Xiao-lei1、2、*, CAO Xue-dong1, YANG Wen-zhi1, and WU Shi-bin1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    DAI Xiao-lei, CAO Xue-dong, YANG Wen-zhi, WU Shi-bin. Flatness Measurement of Large Annular Planes Based on Three-point Method[J]. Opto-Electronic Engineering, 2010, 37(5): 52 Copy Citation Text show less

    Abstract

    A method of flatness measurement of large annular planes was designed based on three-point method. By measuring the local curvature of the annular, the overall curve was connected and the flatness measurement of the whole annular was obtained. The measuring principle of three-point method was introduced, as well as the application of three-point method on measurement of large annular planes. The factors of zero error which impact the measurement result were analyzed. Experiments show that the method could solve the problem of flatness measurement of large annular flat parts.
    DAI Xiao-lei, CAO Xue-dong, YANG Wen-zhi, WU Shi-bin. Flatness Measurement of Large Annular Planes Based on Three-point Method[J]. Opto-Electronic Engineering, 2010, 37(5): 52
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