• Acta Optica Sinica
  • Vol. 35, Issue 12, 1205001 (2015)
Yang Yiming1、2、*, Du Guohao1, Tan Hai1、2, ang Yushuang3, and Xiao Tiqiao1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/aos201535.1205001 Cite this Article Set citation alerts
    Yang Yiming, Du Guohao, Tan Hai, ang Yushuang, Xiao Tiqiao. Research of Several Influential Factors on Reconstruction of Three- Dimensional X-Ray Diffraction[J]. Acta Optica Sinica, 2015, 35(12): 1205001 Copy Citation Text show less
    References

    [1] Poulsen H F. Three-Dimensional X-Ray Diffraction Microscopy-Mapping Polycrystals and Their Dynamics[M]. Berlin: Springer Berlin Heidelberg, 2004, 221-222.

    [2] Oddershede J, Schmidt S, Poulsen H F, et al.. Grain-resolved elastic strains in deformed copper measured by three-dimensional X-ray diffraction[J]. Mater Charact, 2011, 62(7): 651-660.

    [3] Offerman S E, van Dijk N H, Sietsma J, et al.. Grain nucleation and growth during phase transformations[J]. Science, 2002, 298(5595): 1003-1005.

    [4] Schmidt S, Nielsen S F, Gundlach C, et al.. Watching the growth of bulk grains during recrystallization of deformed metals[J]. Science, 2004, 305(5681): 229-232.

    [5] Lyckegaard A, Lauridsen E M, Ludwig W, et al.. On the use of Laguerre Tessellations for representations of 3D grain structures[J]. Adv Eng Mater, 2011, 13(3): 165-170.

    [6] Poulsen H F, Nielsen S F, Lauridsen E M, et al.. Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders[J]. Journal of Applied Crystallography, 2001, 34: 751-756.

    [7] Poulsen H F. An introduction to three-dimensional X-ray diffraction microscopy[J]. Journal of Applied Crystallography, 2012, 45: 1084- 1097.

    [8] Chatterjee K. Determination of Grain-Level Strain and Proposing a New Method of Strain Determination for Three Dimensional X-ray Diffraction (3DXRD)[D]. Urbana-Champaign: University of Illinois at Urbana-Champaign, 2014: 10-14

    [9] Schmidt S. GrainSpotter: a fast and robust polycrystalline indexing algorithm[J]. Journal of Applied Crystallography, 2014, 47: 276-284.

    [10] Oddershede J, Schmidt S, Poulsen H F, et al.. Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction[J]. Journal of Applied Crystallography, 2010, 43: 539-549.

    [11] Xiao Tiqiao, Xie Honglan, Deng Biao, et al.. Progresses of X-ray imaging methodology and its applications at Shanghai Synchrotron Radiation Facility[J]. Acta Optica Sinica, 2014, 34(1): 0100001.

    [12] Liang Chuanhui, Wang Yudan, Du Guohao, et al.. Research on the contrast enhancement algorithm of synchrotron radiation X-ray image [J]. Acta Optica Sinica, 2015, 35(3): 0310003.

    [13] Qi Juncheng, Ren Yuqi, Du Guohao, et al.. Multiple contrast micro-computed tomography system based on X-ray grating imaging[J]. Acta Optica Sinica, 2013, 33(10): 1034001.

    [14] Ye Linlin, Xue Yanling, Tan Hai, et al.. X-ray phase contrast micro-tomography and its application in quantitative 3D imaging study of wild ginseng characteristic microstructures[J]. Acta Optica Sinica, 2013, 33(12): 1234002.

    [15] Suter R M, Hennessy D, Xiao C, et al.. Forward modeling method for microstructure reconstruction using X-ray diffraction microscopy: single-crystal verification[J]. Review of Scientific Instruments, 2006, 77(12): 12.

    Yang Yiming, Du Guohao, Tan Hai, ang Yushuang, Xiao Tiqiao. Research of Several Influential Factors on Reconstruction of Three- Dimensional X-Ray Diffraction[J]. Acta Optica Sinica, 2015, 35(12): 1205001
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