• Laser & Optoelectronics Progress
  • Vol. 59, Issue 5, 0524002 (2022)
Hui Meng1, Mingjun Wang2、*, Duo Ning3, and Shenhe Ren1
Author Affiliations
  • 1College of Physics & Electronic Engineering, Xianyang Normal University, Xianyang , Shaanxi 712000, China
  • 2School of Automation, Xi'an University of Technology, Xi'an , Shaanxi 710021, China
  • 3School of Electrical & Control Engineering, Shaanxi University of Science and Technology, Xi'an , Shaanxi 710021, China
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    DOI: 10.3788/LOP202259.0524002 Cite this Article Set citation alerts
    Hui Meng, Mingjun Wang, Duo Ning, Shenhe Ren. Phase Distribution of Laguerre-Gaussian Beams on a Layered Topological Insulator Dielectric Film[J]. Laser & Optoelectronics Progress, 2022, 59(5): 0524002 Copy Citation Text show less

    Abstract

    Herein, the phase distribution characteristics of Laguerre-Gaussian (LG) beams incident on a layered topological insulator (TI) thin film are studied using the plane angular spectrum expansion method and transmission matrix theory. Numerical results show that the phase structure of LG beams in the reflected and transmitted fields is affected by the changes in topological magneto-electric polarizability. Particularly, the center axis of the phase distribution of p-wave shifts left or right. This research on the phase distribution characteristics of LG beams incident on layered topological insulator thin films has significance in wireless laser communication, optical trapping, particle manipulation, nonlinear optics, information coding, and other fields.
    Hui Meng, Mingjun Wang, Duo Ning, Shenhe Ren. Phase Distribution of Laguerre-Gaussian Beams on a Layered Topological Insulator Dielectric Film[J]. Laser & Optoelectronics Progress, 2022, 59(5): 0524002
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