Author Affiliations
1 School of Information and Communication Engineering, North University of China, Taiyuan, Shanxi 0 30051, China2 China Special Equipment and Research Institute, Beijing 100029, Chinashow less
Fig. 1. Scattering effect between surface wave and defect
Fig. 2. Experimental diagram
Fig. 3. Laser ultrasonic platform
Fig. 4. Experimental samples
Fig. 5. Sample size
Fig. 6. Direct wave spectrum diagram
Fig. 7. B-scanning images of surface defect. (a) Defect depth of 0.40 mm; (b) defect depth of 0.30 mm; (c) defect depth of 0.20 mm; (d) defect depth of 0.10 mm; (e) defect depth of 0.08 mm
Fig. 8. Frequency spectrum energy diagrams of reflection/transmission signals. (a) Defect depth of 0.40 mm; (b) defect depth of 0.30 mm; (c) defect depth of 0.20 mm; (d) defect depth of 0.10 mm; (e) defect depth of 0.08 mm (red solid lines and blue solid lines represent curves of transmission surface wave and defect reflection surface wave, respectively)
Fig. 9. Relationship between surface defect depth and corresponding wavelength
Fig. 10. B-scanning images at different distances between excitation point and detection point
Fig. 11. Frequency spectrum energy diagrams of reflection/transmission signal when distance between excitation point and detection point is different. (a) Distance of 5 mm; (b) distance of 10 mm ; (c) distance of 15 mm; (d) distance of 20 mm; (e) distance is of 25 mm (the red solid lines and blue solid lines represent curves of transmission surface wave and defect reflection surface wave, respectively)
Fig. 12. Samples with different materials. (a) Steel sample; (b) aluminum sample
Fig. 13. Frequency spectrum energy diagrams of reflection/transmission signals of samples with different materials. (a) Aluminum; (b) steel (the red solid lines and blue solid lines represent curves of transmission surface wave and defect reflection surface wave, respectively)
Sample | Defect depth /mm |
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A | 0.40 | B | 0.30 | C | 0.20 | D | 0.10 | E | 0.08 |
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Table 1. Defect depth
Sample | Defect location /mm | Error /% |
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A | 6.7 | 4.2 | B | 6.9 | 1.4 | C | 6.9 | 1.4 | D | 7.1 | 1.4 | E | 7.1 | 1.4 |
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Table 2. Measured location and error of defects
Sample defect depth /mm | Frequency /MHz | Wavelength /mm | Measured defect depth /mm | Error /% |
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0.40 | 1.82 | 1.602 | 0.401 | 0.25 | 0.30 | 2.60 | 1.122 | 0.281 | 6.33 | 0.20 | 3.39 | 0.860 | 0.215 | 7.50 | 0.10 | 7.60 | 0.384 | 0.096 | 4.00 | 0.08 | 9.50 | 0.307 | 0.077 | 3.75 |
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Table 3. Measured defect depth and error
Distance /mm | Frequency /MHz | Wavelength /mm | Measured defect depth /mm | Error /% |
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5 | 1.96 | 1.488 | 0.372 | 7.00 | 10 | 1.87 | 1.559 | 0.390 | 2.50 | 15 | 1.71 | 1.705 | 0.426 | 6.50 | 20 | 1.85 | 1.576 | 0.394 | 1.50 | 25 | 1.79 | 1.629 | 0.407 | 1.75 |
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Table 4. Measured defect depth and error at different distances between excitation point and detection point
Material | Sample defect depth /mm | Frequency /MHz | Wavelength /mm | Measured defect depth /mm | Error /% |
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Aluminum | 0.40 | 1.87 | 1.559 | 0.390 | 2.50 | Steel | 0.40 | 1.85 | 1.514 | 0.379 | 5.25 |
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Table 5. Defect depth and error of samples with different materials