Detection and Evaluation of Surface Defects Based on Critical Frequency Method by Laser Ultrasonic

Haiyang Li; Qiaoxia Li; Zhaoba Wang; Qianghua Pan

doi:10.3788/AOS201838.0712003

Journals >Acta Optica Sinica >Volume 38 >Issue 7 >Page 0712003 > Article

Acta Optica Sinica
Vol. 38, Issue 7, 0712003 (2018)

Detection and Evaluation of Surface Defects Based on Critical Frequency Method by Laser Ultrasonic

Haiyang Li^1、*, Qiaoxia Li¹, Zhaoba Wang¹, and Qianghua Pan²

Author Affiliations

¹ School of Information and Communication Engineering, North University of China, Taiyuan, Shanxi 0 30051, China

² China Special Equipment and Research Institute, Beijing 100029, China

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DOI: 10.3788/AOS201838.0712003 Cite this Article Set citation alerts

Haiyang Li, Qiaoxia Li, Zhaoba Wang, Qianghua Pan. Detection and Evaluation of Surface Defects Based on Critical Frequency Method by Laser Ultrasonic[J]. Acta Optica Sinica, 2018, 38(7): 0712003 Copy Citation Text

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Haiyang Li, Qiaoxia Li, Zhaoba Wang, Qianghua Pan. Detection and Evaluation of Surface Defects Based on Critical Frequency Method by Laser Ultrasonic[J]. Acta Optica Sinica, 2018, 38(7): 0712003

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