• Laser & Optoelectronics Progress
  • Vol. 58, Issue 22, 2212003 (2021)
Zhaoxu Wang1、2, Yanjun Fu1、2、*, Ye Li1、2, Kejun Zhong1、2, and Wei Bao1、2
Author Affiliations
  • 1Key Laboratory of Nondestructive Testing Technology, Ministry of Education, Nanchang Hangkong University, Nanchang, Jiangxi 330063, China
  • 2School of Measuring and Optical Engineering, Nanchang Hangkong University, Nanchang, Jiangxi 330063, China
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    DOI: 10.3788/LOP202158.2212003 Cite this Article Set citation alerts
    Zhaoxu Wang, Yanjun Fu, Ye Li, Kejun Zhong, Wei Bao. Calibration Method for Line Structured Light Measurement System Based on Vanishing Point[J]. Laser & Optoelectronics Progress, 2021, 58(22): 2212003 Copy Citation Text show less

    Abstract

    Aiming at the limitations of complex calibration model and the need for special targets of the existing line structured light measurement system, a new calibration method for the line structured light measurement system is proposed. The precision guide rail is used to move the plane target at least twice in one direction in space, creating a set of parallel feature lines on the laser plane. According to the principle of vanishing point, a new mathematical model is established to calibrate the direct correspondence between the imaging pixels and the one-dimensional information in the moving direction. Changing the moving direction of the guide rail, the pixel-dimension correspondence in the other two orthogonal spatial directions can be obtained by the same way. Compared with the traditional calibration methods, the proposed calibration model does not need to calibrate multiple sets of spatial relationships of the system, which correspondingly simplifies the traditional calibration process and reduces the accumulation of errors. In addition, the target can be an ordinary plane, which avoids the difficult manufacturing of a special target. The experimental results show that the root mean square error (RMSE) of the measurement results of the proposed method is 0.0359 mm, the mean absolute error (MAE) is 0.0306 mm, which can be efficiently used for line structured light three-dimensional (3D) measurement.
    Zhaoxu Wang, Yanjun Fu, Ye Li, Kejun Zhong, Wei Bao. Calibration Method for Line Structured Light Measurement System Based on Vanishing Point[J]. Laser & Optoelectronics Progress, 2021, 58(22): 2212003
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