[1] P. Andersson. Opt. Eng., 45, 034301(2006).

[2] A. Bulyshev, F. Amzajerdian, V. E. Roback, G. Hines, D. Pierrottet, R. Reisse. Appl. Opt., 53, 2583(2014).

[3] J. Smeeckaert, C. Mallet, N. David, N. Chehata, A. Ferraz. Rem. Sens. Environ., 138, 134(2013).

[4] B. Lutzmann, P. Steinvall. Proc. SPIE, 7835, 783504(2010).

[5] J. Busck. Opt. Eng., 44, 116001(2005).

[6] J. Busck, H. Heiselberg. Appl. Opt., 43, 4705(2004).

[7] M. Laurenzis, F. Christnacher, D. Monnin. Opt. Lett., 32, 3146(2007).

[8] M. Laurenzis, F. Christnacher, N. Metzger, E. Bacher, I. Zielenski. Proc. SPIE, 7298, 729833(2009).

[9] X. Wang, Y. Cao, W. Cui, X. Liu, S. Fan, D. Lu, Y. Zhou, Y. Li. Proc. SPIE, 9273, 927327(2014).

[10] X. Wang, W. Cui, X. Liu, S. Fan, Y. Zhou, Y. Li. Proc. SPIE, 9260, 92604L(2014).

[11] X. Zhang, Y. Wu, H. Chen, H. Yan. Opt. Commun., 312, 47(2014).

[12] S. He, L. Li, Y. Zhou. Optoelectron. Lett., 5, 248(2009).

[13] S. He, Y. Zhou, S. Fan, J. He, H. Zeng. Infrared and Laser Engineering, 37, 178(2008).

[14] S. Xu, S. S. Zhang, S. Tang. 2011 International Conference on Electronics and Optoelectronics (ICEOE 2011), 2, 237(2011).

[15] X. Wang, Y. Li, Y. Zhou. Appl. Opt., 52, 7399(2013).

[16] C. Yuan, S. Chen, Y. Zhang, Z. Qiu, G. Ni. Proc. SPIE, 7513, 75132P(2009).