• Optical Instruments
  • Vol. 46, Issue 5, 31 (2024)
Qifan JIA1, Xuanhong JIN1,*, Pengcheng XIAO2, and Hangyu HE1
Author Affiliations
  • 1School of Optical-EleCtrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093
  • 2. School of Microelectronics Fudan University, Shanghai 201203, China
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    DOI: 10.3969/j.issn.1005-5630.202310260120 Cite this Article
    Qifan JIA, Xuanhong JIN, Pengcheng XIAO, Hangyu HE. Design of ATE data storage and transmission system for optical chip testing[J]. Optical Instruments, 2024, 46(5): 31 Copy Citation Text show less
    ATE structure block
    Fig. 1. ATE structure block
    GPMC synchronous burst write timing in address/data multiplexing mode
    Fig. 2. GPMC synchronous burst write timing in address/data multiplexing mode
    Embedded system workflow
    Fig. 3. Embedded system workflow
    Signal offset in FPGA
    Fig. 4. Signal offset in FPGA
    Control signal latch circuit
    Fig. 5. Control signal latch circuit
    Schematic diagram of GPMC interface module
    Fig. 6. Schematic diagram of GPMC interface module
    MIG_controller state diagram
    Fig. 7. MIG_controller state diagram
    System implementation and verification platform
    Fig. 8. System implementation and verification platform
    Verify the write function of the system
    Fig. 9. Verify the write function of the system
    Verification of read data and storage function
    Fig. 10. Verification of read data and storage function
    Waveform of GPMC writing selection signal
    Fig. 11. Waveform of GPMC writing selection signal
    Waveforms of reading selection with waiting
    Fig. 12. Waveforms of reading selection with waiting
    突发长度传输次数/次误码率
    4800%
    8400%
    16200%
    Table 1. System testing results
    Qifan JIA, Xuanhong JIN, Pengcheng XIAO, Hangyu HE. Design of ATE data storage and transmission system for optical chip testing[J]. Optical Instruments, 2024, 46(5): 31
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