Optical chip is an important device to realize photoelectric signal conversion in optical fiber system, so it needs to undergo a lot of tests after manufacturing.As the main equipment used in chip testing today, integrated circuit automatic test equipment (ATE) has the advantages of high automation, high precision, wide test range and fast speed in the test of optical chip. Since the ATE device generates a great many data each time it is tested, and a long test time will increase the test cost, so the ATE system requires a high data rate. In order to improve the Data transmission efficiency and storage during optical chip testing, a high-speed data storage and transmission system based on embedded system chip and FPGA was designed. The enhanced direct memory access module was used to drive the GPMC interface to improve the transmission bandwidth, and the data transmission mode was optimized on FPGA to improve the DDR3 SDRAM utilization. After testing on the board, the read and write bandwidth in single channel reaches 413.3 Mbit/s and 984.6 Mbit/s respectively, realizing high-speed transmission and stable storage of data in the system.