• Laser & Optoelectronics Progress
  • Vol. 57, Issue 2, 21104 (2020)
Li Qihui1、2, Ding Yalin1、*, Xiu Jihong1, Liu Chongyang1、2, Cai Yiming1、2, and Liao Jinfeng1、2
Author Affiliations
  • 1Key Laboratory of Airborne Optical Image and Measurement, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
  • 2University of Chinese Academy of Science, Beijing 100049, China
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    DOI: 10.3788/LOP57.021104 Cite this Article Set citation alerts
    Li Qihui, Ding Yalin, Xiu Jihong, Liu Chongyang, Cai Yiming, Liao Jinfeng. Self-Collimation Inspection and Focusing Method Based on Image Processing[J]. Laser & Optoelectronics Progress, 2020, 57(2): 21104 Copy Citation Text show less
    Schematic of ideal imaging system
    Fig. 1. Schematic of ideal imaging system
    Relationship between light intensity and defocusing distance
    Fig. 2. Relationship between light intensity and defocusing distance
    Schematic of image auto-collimation inspection and focusing system
    Fig. 3. Schematic of image auto-collimation inspection and focusing system
    Schematics of targets. (a) Grating target; (b) radial target
    Fig. 4. Schematics of targets. (a) Grating target; (b) radial target
    Defocus diagrams of radial and grating targets. (a) 26th image; (b) 38th image; (c) 51st image
    Fig. 5. Defocus diagrams of radial and grating targets. (a) 26th image; (b) 38th image; (c) 51st image
    Normalized eigenvalue curves of the defocus image. (a) Lena; (b) grating; (c) radiation; (d) contrast of three targets
    Fig. 6. Normalized eigenvalue curves of the defocus image. (a) Lena; (b) grating; (c) radiation; (d) contrast of three targets
    ParameterSobelLaplacianSq-Grad
    RadiationGratingLenaRadiationGratingLenaRadiationGratingLena
    w1/22026142018102028
    T0.92910.00650.34750.98580.76080.803510.82970.4806
    Table 1. Comparative analysis of inspection and focusing results
    Li Qihui, Ding Yalin, Xiu Jihong, Liu Chongyang, Cai Yiming, Liao Jinfeng. Self-Collimation Inspection and Focusing Method Based on Image Processing[J]. Laser & Optoelectronics Progress, 2020, 57(2): 21104
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