Self-Collimation Inspection and Focusing Method Based on Image Processing

Li Qihui; Ding Yalin; Xiu Jihong; Liu Chongyang; Cai Yiming; Liao Jinfeng

doi:10.3788/LOP57.021104

Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 2 >Page 21104 > Article

Laser & Optoelectronics Progress
Vol. 57, Issue 2, 21104 (2020)

Self-Collimation Inspection and Focusing Method Based on Image Processing

Li Qihui^1、2, Ding Yalin^1、*, Xiu Jihong¹, Liu Chongyang^1、2, Cai Yiming^1、2, and Liao Jinfeng^1、2

Author Affiliations

¹Key Laboratory of Airborne Optical Image and Measurement, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

²University of Chinese Academy of Science, Beijing 100049, China

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DOI: 10.3788/LOP57.021104 Cite this Article Set citation alerts

Li Qihui, Ding Yalin, Xiu Jihong, Liu Chongyang, Cai Yiming, Liao Jinfeng. Self-Collimation Inspection and Focusing Method Based on Image Processing[J]. Laser & Optoelectronics Progress, 2020, 57(2): 21104 Copy Citation Text

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