Characterization of Electrical Tapes by Optical Coherence Tomography

Liu Kangkang; Meng Li; Zhang Ning; Sun Zhenwen; Xie Bin; Liu Xingxing; Xu Xiaojing

doi:10.3788/LOP55.011101

Journals >Laser & Optoelectronics Progress >Volume 55 >Issue 1 >Page 11101 > Article

Laser & Optoelectronics Progress
Vol. 55, Issue 1, 11101 (2018)

Characterization of Electrical Tapes by Optical Coherence Tomography

Liu Kangkang¹, Meng Li¹, Zhang Ning^2、3、*, Sun Zhenwen², Xie Bin³, Liu Xingxing³, and Xu Xiaojing²

Author Affiliations

¹School of Forensic Science, People''s Public Security University of China, Beijing 100038, China

²National Engineering Laboratory for Forensic Science, Institute of Forensic Science, Ministry of Public Security,Beijing 100038, China

³Public Security Bureau of Xingguo County, Ganzhou, Jiangxi 342400, China

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DOI: 10.3788/LOP55.011101 Cite this Article Set citation alerts

Liu Kangkang, Meng Li, Zhang Ning, Sun Zhenwen, Xie Bin, Liu Xingxing, Xu Xiaojing. Characterization of Electrical Tapes by Optical Coherence Tomography[J]. Laser & Optoelectronics Progress, 2018, 55(1): 11101 Copy Citation Text

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