• Laser & Optoelectronics Progress
  • Vol. 56, Issue 12, 120101 (2019)
Xizheng Ke, Ke Yang*, and Ying Zhang
Author Affiliations
  • School of Automation and Information Engineering, Xi'an University of Technology, Xi'an, Shaanxi 710048, China
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    DOI: 10.3788/LOP56.120101 Cite this Article Set citation alerts
    Xizheng Ke, Ke Yang, Ying Zhang. Experimental Study onWavefront Distortion Detection Using CAPIS Technology[J]. Laser & Optoelectronics Progress, 2019, 56(12): 120101 Copy Citation Text show less

    Abstract

    The technology of computationally adaptive plenoptic imaging system (CAPIS) can simultaneously record the position and direction of a signal, obtain the distorted wavefront slope from the light field information, and thus perform the wavefront reconstruction. This study investigates the optical wavefront distortion detected by the CAPIS technology, and provides a numerical calculation model for simulation analysis. The results denote that the CAPIS technology can accurately detect a low-order aberration wavefront. Furthermore, the root mean square value of the wavefront residual is less than 0.1λ. The experimental light path is established, and the detection of the low-order aberration wavefront is realized and the root mean square value of the wavefront residual is less than 0.5λ. The simulation and experimental results denote that the CAPIS technology can effectively detect a low-order aberration wavefront, which is considerably significant for exploring one large-field wavefront detection method.
    Xizheng Ke, Ke Yang, Ying Zhang. Experimental Study onWavefront Distortion Detection Using CAPIS Technology[J]. Laser & Optoelectronics Progress, 2019, 56(12): 120101
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