• Acta Physica Sinica
  • Vol. 68, Issue 10, 107501-1 (2019)
Ji-Yu Fan1, Yu Feng1, Di Lu1, Wei-Chun Zhang1, Da-Zhi Hu1, Yu-E Yang1, Ru-Jun Tang2, Bo Hong3, Lang-Sheng Ling4, Cai-Xia Wang5, Chun-Lan Ma6、*, and Yan Zhu1、*
Author Affiliations
  • 1College of Science, Nanjing University of Aeronautics and Astronautics, Nanjing 210006, China
  • 2Department of Physics, Soochow University, Suzhou 215006, China
  • 3Department of Materials, China Jiliang University, Hangzhou 310018, China
  • 4High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei 230031, China
  • 5Department of Physics, Yangzhou University, Yangzhou 225009, China
  • 6Jiangsu Key Laboratory of Micro and Nano Heat Fluid Flow Technology and Energy Application, School of Mathematics and Physics, Suzhou University of Science and Technology, Suzhou 215009, China
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    DOI: 10.7498/aps.68.20190019 Cite this Article
    Ji-Yu Fan, Yu Feng, Di Lu, Wei-Chun Zhang, Da-Zhi Hu, Yu-E Yang, Ru-Jun Tang, Bo Hong, Lang-Sheng Ling, Cai-Xia Wang, Chun-Lan Ma, Yan Zhu. Magnetic and eletronic transport properties in n-type diluted magnetic semiconductor Ge0.96–xBixFe0.04Te film [J]. Acta Physica Sinica, 2019, 68(10): 107501-1 Copy Citation Text show less

    Abstract

    The epitaxial thin films of Ge0.96 xBixFe0.04Te are deposited on BaF2 substrates by using pulsed laser deposition technique. The thin films with three different compositions i.e. Ge0.8Bi0.2Te, Ge0.76Bi0.2Fe0.04Te, and Ge0.64Bi0.32Fe0.04Te are prepared in this wok. Their high-quality epitaxy and crystallinity are confirmed by X-ray diffraction and atomic force microscopy. According to the measurements of Hall effect variation, we find that each of all curves exhibits a negative slope for the different films as the temperature varies from low temperature to room temperature, indicating that Ge0.96 xBixFe0.04Te films are n-type material because the substitution of Bi for Ge makes the carriers change from holes into electrons. Temperature dependence of resistivity confirms that the electronic transport behavior for each of Ge0.96 xBixFe0.04Te thin films exhibits a typical semiconductor characteristic. From the measurements of temperature dependence of electronic transport under various external magnetic fields, we find that the Ge0.64Bi0.32Fe0.04Te thin film shows some magnetoresistive effect while other composition films do not possess such a property. Based on the linear fitting of temperature dependence of magnetic susceptibility in high temperature and low temperature region, the magnetic property of Ge0.64Bi0.32Fe0.04Te thin film changes from 253 K. Together with the study of magnetic susceptibility curve in the paramagnetic region, the Curie-Weiss temperature is determined to be 102 K. At a low temperature of 10.0 K, we observe an obvious ferromagnetic hystersis loop in Ge0.64Bi0.32Fe0.04Te instead of in Ge0.76Bi0.2Fe0.04Te thin film. These results imply that the increase of Bi dopant is main reason for the establishment of ferromagnetic ordering state. The carrier concentration increases and thus promotes the carriers transporting the Ruderman-Kittel-Kasuya-Yoshida interaction, thereby leading to the separated Fe ions producing the magnetic interaction and forming an n-type diluted magnetic semiconductor.
    Ji-Yu Fan, Yu Feng, Di Lu, Wei-Chun Zhang, Da-Zhi Hu, Yu-E Yang, Ru-Jun Tang, Bo Hong, Lang-Sheng Ling, Cai-Xia Wang, Chun-Lan Ma, Yan Zhu. Magnetic and eletronic transport properties in n-type diluted magnetic semiconductor Ge0.96–xBixFe0.04Te film [J]. Acta Physica Sinica, 2019, 68(10): 107501-1
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