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    Journals >Laser & Optoelectronics Progress >Volume 55 >Issue 5 >Page 051602 > Article
    • Laser & Optoelectronics Progress
    • Vol. 55, Issue 5, 051602 (2018)
    Controllable Modulation of Surface Plasmon Resonance Wavelength of ITO Thin Films
    Xinyang Cai1、1; , Xinwei Wang、2*; *; , Ruxue Li1、1; , Dengkui Wang1、1; , Xuan Fang1、1; , Dan Fang1、1; , Yuping Zhang1、3; , Xiuping Sun1、1; , Xiaohua Wang1、1; , and Zhipeng Wei1、1;
    Author Affiliations
  • 1 State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, Changchun, Jilin 130022, China
  • 1 State Key Laboratory of Supramolecular Structure and Material, Institute of Theoretical Chemistry,Jilin University, Changchun, Jilin 130022, China
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    DOI: 10.3788/LOP55.051602 Cite this Article Set citation alerts
    Xinyang Cai, Xinwei Wang, Ruxue Li, Dengkui Wang, Xuan Fang, Dan Fang, Yuping Zhang, Xiuping Sun, Xiaohua Wang, Zhipeng Wei. Controllable Modulation of Surface Plasmon Resonance Wavelength of ITO Thin Films[J]. Laser & Optoelectronics Progress, 2018, 55(5): 051602 Copy Citation Text show less
    Dielectric permittivity of ITO films with different thicknesses. (a) Real part; (b) imaginary part
    Fig. 1. Dielectric permittivity of ITO films with different thicknesses. (a) Real part; (b) imaginary part
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    XRD patterns of ITO films
    Fig. 2. XRD patterns of ITO films
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    Carrier concentration and resistivity of ITO films versus film thickness
    Fig. 3. Carrier concentration and resistivity of ITO films versus film thickness
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    ε'1, ε″1 and carrier concentration of ITO films with different thicknesses
    Fig. 4. ε'1, ε″1 and carrier concentration of ITO films with different thicknesses
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    Abstract
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    Xinyang Cai, Xinwei Wang, Ruxue Li, Dengkui Wang, Xuan Fang, Dan Fang, Yuping Zhang, Xiuping Sun, Xiaohua Wang, Zhipeng Wei. Controllable Modulation of Surface Plasmon Resonance Wavelength of ITO Thin Films[J]. Laser & Optoelectronics Progress, 2018, 55(5): 051602
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    Paper Information
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