• Laser & Optoelectronics Progress
  • Vol. 53, Issue 6, 61202 (2016)
Gao Kai*
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/lop53.061202 Cite this Article Set citation alerts
    Gao Kai. Numerical Simulation of Micro-Stress Measured by Heterodyne Interference Technology Based on Total Reflection[J]. Laser & Optoelectronics Progress, 2016, 53(6): 61202 Copy Citation Text show less
    References

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    Gao Kai. Numerical Simulation of Micro-Stress Measured by Heterodyne Interference Technology Based on Total Reflection[J]. Laser & Optoelectronics Progress, 2016, 53(6): 61202
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