Contents
2016
Volume: 23 Issue 5
21 Article(s)

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Research Article
Support Vector Machine Identification of Nonlinear System Under Basis Function
WANG Jian-hong, XU Ying, XIONG Zhao-hua, and XU Xin
To the problem of nonlinear system identification, the nonlinear system is expanded in a linear regression form under one basis function set.When the basis function set is known, the problem of how to identify the nonlinear system is transformed to estimate the unknown parameter vector exists in the linear regression f
Electronics Optics & Control
  • Publication Date: Jan. 01, 1900
  • Vol. 23, Issue 5, 11 (2016)
A Novel Two-Stage Guidance Law for Multi-missile Salvo Attack
LIU Jia-xin, ZHOU Rui, and DING Quan-xin
Electronics Optics & Control
  • Publication Date: Jan. 01, 1900
  • Vol. 23, Issue 5, 16 (2016)
Semi-supervised Classification of Multi/Hyperspectral Images Based on Cluster Ensemble
LYU Jun-wei, FAN Li-heng, DENG Jiang-sheng, and SHI Xiao-hang
A semi-supervised, cluster-ensemble based method for the classification of multi/hyperspectral images is presented.Spectral clustering is a graph theory based clustering algorithm taking similarity as the basis, and has become increasingly popular in recent years.It can deal with arbitrary distribution of dataset but w
Electronics Optics & Control
  • Publication Date: Jan. 01, 1900
  • Vol. 23, Issue 5, 30 (2016)
Fighter Aircraft Effectiveness Evaluation Based on Information Dominance in Information Warfare Circumanstance
WANG Yun-hui
Electronics Optics & Control
  • Publication Date: Jan. 01, 1900
  • Vol. 23, Issue 5, 60 (2016)
Application of Improved EMD Based on GEP in Instantaneous Frequency Measurement
YANG Bo, and LI Shi-ping
Electronics Optics & Control
  • Publication Date: Jan. 01, 1900
  • Vol. 23, Issue 5, 76 (2016)
High Precision Temperature Control System of InGaAs Multi-channel Polarization Detectors
WANG Xiao-guang, QIAN Xiao-dong, HONG Jin, HU Ya-dong, ZHANG Ai-wen, and BAO Jian
Dark current is one of the important factors that affect measurement accuracy of infrared detector, while the size and fluctuation of the dark current is mainly affected by the working temperature of the device.In order to meet the accuracy requirement of the temperature gradient and temperature control of device, we d
Electronics Optics & Control
  • Publication Date: Jan. 01, 1900
  • Vol. 23, Issue 5, 94 (2016)